Thin film NRP 13C Annealing Pulsed laser deposition Raman spectroscopy Multilayer Ferromagnetic resonance Nuclear reaction analysis Magnetic anisotropy Nickel Nuclear resonance profiling NRP Transparent conductive oxide TCO Aluminum Diffusion Adsorption 7550Pp Silica Indium oxide 27Ald p&α 15N Gallium oxide AFM Passivation XRD Atomic Layer Deposition ALD Energy loss Acoustic GaMnAs ADSORPTION DESORPTION HYSTERESIS XPS Zinc oxide Channeling PIXE Adsorbed layers Epitaxial growth Al2O3 Topological defects 18O 27Aldp Aluminium Metal-insulator transition Interface defects Oxygen deficiency EPR Periodic multilayer Gold 27Alda Magnetic semiconductors Topological insulators Oxidation 7630Lh Ion beam analysis Acoustic propreties of solid 7550Ee Silicon Carbide ALD Capillary condensation HfO2 Evaluation RBS Adsorption Isotherms X-ray diffraction 17O Measurement Thin films Nanostructures Density functional theory 6855Jk Auger electron spectroscopy AES 18O resonance Ageing Ion implantation Epitaxy AC susceptibility Sputtering Hysteresis NRA Photoluminescence Magnetization curves 2H 17Opp Alloys 3C-SiC Silicon Silicon carbide Growth Isotopic Tracing 17Op Kossel diffraction Rutherford backscattering spectrometry RBS Low energy electron diffraction LEED Nitridation Pb centers Charge exchange SiC 8140Ef Nanoparticles Stable isotopic tracing Defects