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Derniers dépôts
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Nicolas Castagnet, Alexandre Boyer, Fabien Escudié. Correlation Between Conducted Injection and Near-Field Scan Immunity in the L-Band. 2024 IEEE International Symposium on Electromagnetic Compatibility and 2024 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), May 2024, Okinawa, Japan. ⟨hal-04618394⟩
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Nguyen Quang, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes. Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number. 26th International Conference "Mixed Design of Integrated Circuits and Systems" (MIXDES 2019), Jun 2019, Rzeszów, Poland. pp.298 - 301, ⟨10.23919/MIXDES.2019.8787050⟩. ⟨hal-02613777⟩